Poster #254

Session 1 Research 0 visits
Cross-Sectional Analysis of Bond Interface Roughness in Silicon-on-Insulator Specimens
Zach Moughamian

Institution: University of Missouri St. Louis

Tags: sectional cross zach moughamian bond interface roughness research university of missouri st. louis session 1
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Session Information

Session I: Friday, October 31, 10:30 AM – 12:00 PM

Location: Exhibit Hall