Poster #328
Using M-line spectrometry and white light interferometry to calculate the thickness and refractive indices of thin film samples.
Olivia McGrew
Institution: Washington State University
Similar Posters
Poster #314
Synthesis and Analysis of Nanoparticles Using Dynamic Light Scattering and Spect...
Praise Gavi
Grambling State University
ViewPoster #206
Solving The Double Well Using Classical and Quantum Mechanical Methods
Tate Arrington
Davidson College
ViewPoster #226
Improving measurement of microwave qudits using millimeter wave photons
Dennis Chunikhin
University of Maryland, College Park
ViewPoster #168
Using Web Scraping and Natural Language Processing Techniques to Identify Key Ch...
Aubin Vertueux Dzossa Bontse
Furman University
ViewPoster #272
Solving the Double Well using the Spectral and Operator Method to Explore Effec...
Bianca Hassan
Davidson College
ViewQR Code
Scan to share this poster
Presenter Status
Not Available
Status updates in real-time
Session Information
Session I: Friday, October 31, 10:30 AM – 12:00 PM
Location: Exhibit Hall